On December 11-12, the China IC Design Industry 2024 Annual Conference opened in Shanghai World Expo Exhibition and Convention Center. This event brought together more than 400 top IC design, sealing test and equipment enterprises at home and abroad to meet friends and gather strength with "exhibition" to jointly build a new era of China's IC industry and create a new future of high-quality development.

       As one of the representatives of domestic IC test equipment suppliers, TBSTest was invited to participate in this event with a number of new generation IC test equipment. TBSTest, with the theme of "TBSTest Journey · Chip future", focused on showing the company's innovative products in the field of multi-type IC test. Including TM8000 series of DRAM chip test system, T800 series of SOC chip test system, M5000 series of Flash chip test system, TP series of IGBT power device test system, has been widely concerned by experts, scholars, application units and industry colleagues.

       With the development of new energy vehicles and artificial intelligence, emerging products such as deep learning and human-computer interaction are gradually commercialized, which has spawned a large number of chip testing demands, and further expanded the application range and industrial boundaries of integrated circuit testing equipment. At present, the domestic IC test field is in a critical period of breaking through the technical bottleneck and breaking the "jam neck" of imported suppliers, and vigorously promoting the localization of integrated circuit test equipment is an important means to solve the security of the industrial chain. With "Born for China and tested for the world" as the driving force, TBSTest actively implements the development strategy of independent innovation, creates a diversified product matrix with ingenuity, brings innovative products and services with diverse performance to industry customers, and lets the industry share the dividends of domestic IC test equipment.