TBSTest and HFUT jointly build a joint laboratory to carry out school-enterprise cooperation to cultivate domestic ATE equipment talents


悦芯科技与合肥工业大学

行校企合作签约仪式

人才培养 | 技术创新 | 社会服务

2024

悦芯科技

合肥工业大学

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On January 23, 2024, in the conference hall of the Science and Technology Building on Tunxi Road Campus of Hefei University of Technology, TBSTest and the School of Instrument Science and Optoelectronic Engineering of Hefei University of Technology held a school-enterprise cooperation signing ceremony. The signing ceremony was attended by Ding Lijian, Vice President of Hefei University of Technology, Huang Yunzhi, Dean of Undergraduate School, Zhao Jinhua, Party Secretary of the School of Instrument Science and Optoelectronic Engineering, Qiu Longzhen, Vice President, Yang Aimin, Executive Vice General Manager of TBSTest, Hua Lei, Senior Director of Application Technology, Feng Jieyun, Director of Human resources, and some representatives of teachers and students of Hefei University of Technology and some representatives of employees of TBSTest.


PART.01

校企签约仪式
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At the signing ceremony, TBSTest and the School of Instrument Science and Optoelectronic Engineering of Hefei University of Technology jointly signed the school-enterprise strategic cooperation framework agreement and the graduate joint training base agreement. According to the agreement, the two sides will jointly carry out the research, development and application of integrated circuit testing technology, and promote the integrated development of industry, university and research.


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校企合作共赢

Founded in 2017, TBSTest is a fresh force in the field of domestic IC test equipment. It has always focused on independent and independent domestic high-end ATE technology, focused on research and development, production and sales of various large-scale IC test equipment, and committed to breaking through the performance and efficiency of domestic ATE, and promoting the localization of ATE replacement. Self-developed and mass-produced SOC chip automated production test equipment T800, power semiconductor test equipment TP1200 and DRAM memory chip mass production test equipment TM8000, filling the gap in the field of domestic high-end IC automated test equipment, is also constantly moving towards serialization and rapidly occupying the domestic market. TBSTest and the School of Instrument Science and Optoelectronic Engineering of Hefei University of Technology have a high degree of correspondence in research content, scientific research achievements and development direction, and have a strong foundation for cooperation. Specifically, semiconductor testing is an engineering technology that includes electronics, machinery, computers, control and other disciplines, which is consistent with the comprehensive knowledge training system of "light, machinery, electricity, calculation, and control" of instrument science and optoelectronic engineering. The professional characteristics of instruments such as precision measurement and error theory are also concentrated in semiconductor testing.


PART.02

校企签约揭牌
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After the signing of the contract, the two sides also carried out the unveiling of the school-enterprise IC test technology joint laboratory and the handover ceremony of TBSTest SOC test system. Through negotiations between the two sides, in order to deepen the integration of industry, university and research, joint research on core technologies was carried out, and the "TBSTest - Joint Laboratory of Integrated Circuit Testing Technology of HEIT" was built. The two sides hope to use the joint laboratory as a bridge and rely on specific projects to achieve resource sharing and complementary advantages, and finally achieve smooth technical approval and widespread promotion of results, so as to provide force for the progress of the integrated circuit testing industry and transport talents for the development of the IC testing industry.

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产教融合共兴

The strategic cooperation with the School of Instrument Science and Optoelectronic Engineering of Hefei University of Technology is an important measure for both sides to give play to their respective advantages and achieve mutual benefit and win-win results, aiming to jointly promote the technological innovation and industrial development of domestic integrated circuit test equipment. The two sides will carry out a series of cooperation around scientific and technological research, personnel training and scientific research achievements transformation and promotion, and will take "industry to serve the country" as the cooperation concept, and jointly create a "national weight" in the field of IC industry, which will have a far-reaching and positive impact on both sides and even the domestic integrated circuit test industry, and inject new vitality into the future development of China's IC industry. Among them, personnel training will be the key area of cooperation. Under the realistic background of the serious shortage of talents in the IC testing industry, the two sides will use team learning, case analysis, field research, simulation training, dual-teacher teaching and other methods to jointly train IC testing technology professionals and improve the practical ability of students in related majors. Meet the market demand for IC test professionals.


PART.03

合作●发展●共赢
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After the signing ceremony, the two sides jointly visited the Scientific Innovation Center of College of Instrument Science and Optoelectronic Engineering.

协同共谱新篇


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