TBSTest to help IC design full chain service promotion seminar test service special event
On the afternoon of June 16th, 2023, the IC Design full chain service Promotion Seminar test service special event jointly organized by TBSTest and Suzhou Zhongke IC Design Center was successfully held in Hilton Hotel Suzhou.
The event was guided by Jiangsu Provincial Department of Industry and Information Technology, sponsored by Suzhou Municipal Bureau of Industry and Information Technology, Suzhou Industrial Park Science and Technology Innovation Committee, and hosted by TBSTest and Suzhou Zhongke.
Zhou Cun, Deputy Director of Science and Technology Innovation Committee of Suzhou Industrial Park, Zuo Zhiwei, Deputy Director of Digital Innovation Department of Science and Technology Innovation Committee of Suzhou Industrial Park attended the event, Mr. Hans Zhang, Chairman and general manager of TBSTest, Mr. Xinyu Liu, Chairman and general manager of Suzhou Zhongke, Comrades in charge of relevant departments of Suzhou Municipal Bureau of Industry and Information Technology and friends from more than 30 IC design and testing enterprises in Suzhou gathered together to discuss the development of integrated circuit testing technology and services.
Zhou Cun, deputy director of the Science and Technology Innovation Committee of Suzhou Industrial Park, expressed full support for holding the offline IC seminar in his speech, pointing out that IC is a strategic, basic and leading industry to enhance the development of modern economy and society, and is also an emerging industry and future industry that Suzhou Industrial Park focuses on building. Chip test service is an important part of the whole chain service of IC design. With the continuous improvement of product performance of chip design enterprises, the demand for reliability and stability test is also increasing, and the test technology is also facing unprecedented challenges and opportunities.
Mr. Xinyu Liu, chairman and general manager of Suzhou Zhongke, shared the content about the IC design full chain service to help enterprises grow. Suzhou Zhongke IC design service can provide customers with relevant technology and resources to provide one-stop full chain service in the process of chip product development, covering the core process of product development of integrated circuit design enterprises. The rapid development of domestic IC design technology has put forward higher requirements for IC design services, and professional, large-scale and industrialized full-chain services will inevitably become a trend.
Mr. Aimin Yang, co-founder and deputy general manager of TBSTest, made a share of "TBSTest's high-performance domestic test machine help chip test", he proposed that TBSTest's domestic high-end IC test machine has the ability and confidence to compete with foreign top equipment, and the continuous growth of China's semiconductor industry and customer demand. It will drive local enterprises to increase investment in research and development, improve technology, enhance product performance, and expand the scale of enterprises. TBSTest not only communicates closely with design companies from the perspective of testing, provides more mass production options and test program comparison, and jointly creates general and unique programs suitable for the product characteristics of design companies, but also carries out in-depth cooperation with design companies in terms of talents, promotes the development of China's IC industry, and cultivates excellent professional and technical talents for the market. According to the actual needs of design companies, TBSTest provides verification suggestions, programs and services for research and development programs; Provide innovative test solutions for chip products; Provide mass production program, program development and optimization suggestions for product mass production. Under the background of the vigorous development of the domestic IC equipment industry, the situation of IC equipment being jammed by foreign manufacturers will gradually ease, and domestic equipment companies will also release more vitality.
Mr. Jiong Liu, assistant general manager of CCID Research Institute, introduced in the sharing that CCID has a complete IC test environment, which can not only do engineering research and development, but also become a provider of high-efficiency test solutions, and implemented a series of initiatives to develop strict standards for test equipment, promote the progress of domestic test equipment quality technology, and gradually realize localization replacement.
At the event, Mr. Xiao Wei, Assistant to General Manager Su Yihong, Mr. Chen Qixin, general manager of Xinxin, Mr. Li Xiaomin, chairman and general manager of Sembcorp, and Mr. Shi Qian, chief of Component Reliability Analysis Center of the Fifth Institute of Electronics of the Ministry of Industry and Information Technology, also made wonderful theme sharing on integrated circuit test technology, chip reliability verification and coordinated development of the industrial chain.
